The aim of this PhD course is to give a theoretical introduction into synchrotron-based characterization methods, which are especially useful for fibre and polymer technology, ranging from bulk material to thin films.
Theoretical descriptions on:
- X-ray interaction with matter
- Basics of synchrotron radiation and x-ray sources
- Refraction and reflection from interfaces
- Diffraction: X-ray diffraction, grazing incidence wide-angle X-rayscattering
- Scattering: X-ray reflectivity, small-angle X-ray scattering, grazing incidence small-angle X-ray scattering
- Coherence: Coherent diffraction imaging, X-ray Photon Correlation Spectroscopy
- Applied examples of in situ and in operando measurements willdeepen the understanding
