SAXS/WAXS/GISAXS Anton Paar SAXSpoint 2.0

Are you curious about nanoscale morphology of your material? We offer characterization on nanoscale level of materials by Small-Angle X-ray Scattering (SAXS) and Wide-Angle X-ray Scattering (WAXS) measurements. SAXS is capable of delivering structural information of dimensions between 1 and 100 nm. The method is accurate, non-destructive and usually requires only a minimum of sample preparation. WAXS like XRD collects X-ray signal scattered at large angle. It provides the information of crystalline structure, e.g. lattice constant and symmetry and crystallinity, i.e. ratio between crystalline and amorphous phases. SAXSpoint 2.0 is a unique, high end, fully automated SAXS/WAXS instrument from Anton Paar. Sample holders for: liquids, solids, powders and thin films.

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