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Stockholm

Electron Microscopy Analysis of Fibre and Polymer-based Materials

Welcome to the course on Electron Microscopy Analysis of Fibre- and Polymer-based Materials! In this course, you will be introduced to different electron microscopy techniques, sample preparation and recent state-of-the-art methodologies within the field of electron microscopy with a specific focus on materials from trees. The course consists of two parts: theoretical, including the lectures […]

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Managing the Innovation Process from the Research Perspective

Course description/Content:  IPR Analysis will use various search engines and mapping tools to determine who owns intellectual property necessary for the practice of a new technology, and who is currently working on creating relevant IPR.  Strategies for controlling IPR, locking-up necessary components, and keeping potential competitors at bay will be discussed.  Market Analysis will distill

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Atomic Force Microscopy (AFM) for Polymer- and Forest-based materials

This course is designed to provide the background, fundamental concepts, and practical knowledge of Atomic Force Microscopy (AFM) in its relation to polymer- and forest-based materials. Doctoral students of this course will learn from experts in the field, get hands-on experience preparing samples, operating various AFM imaging modes and analysing AFM data. Following this course

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Managing the Innovation Process from the Research Perspective

IPR Analysis will use various search engines and mapping tools to determine who owns intellectual property necessary for the practice of a new technology, and who is currently working on creating relevant IPR.  Strategies for controlling IPR, locking-up necessary components, and keeping potential competitors at bay will be discussed.  Market Analysis will distill a realistic

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Synchrotron Characterization Methods in Fibre and Polymer Technology – Theory – FKF3420

Theoretical descriptions on: X-ray interaction with matter Basics of synchrotron radiation and x-ray sources Refraction and reflection from interfaces Diffraction: X-ray diffraction, grazing incidence wide-angle X-ray scattering Scattering: X-ray reflectivity, small-angle X-ray scattering, grazing incidence small-angle X-ray scattering Coherence: Coherent diffraction imaging, X-ray Photon Correlation Spectroscopy Applied examples of in situ and in operando measurements

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