Are you curious about nanoscale morphology of your material? We offer characterization on nanoscale level of materials by Small-Angle X-ray Scattering (SAXS) and Wide-Angle X-ray Scattering (WAXS) measurements. SAXS is capable of delivering structural information of dimensions between 1 and 100 nm. The method is accurate, non-destructive and usually requires only a minimum of sample preparation. WAXS like XRD collects X-ray signal scattered at large angle. It provides the information of crystalline structure, e.g. lattice constant and symmetry and crystallinity, i.e. ratio between crystalline and amorphous phases. SAXSpoint 2.0 is a unique, high end, fully automated SAXS/WAXS instrument from Anton Paar. Sample holders for: liquids, solids, powders and thin films.
Treesearch aims at creating a national platform to support the research on new materials from the forest. Research projects conducted within Treesearch research areas and the researchers who are active in these projects are welcome to join the platform.
Email
info@treesearch.se
Mail adress
Teknikringen 38a
100 44 Stockholm
