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Synchrotron Characterization Methods in Fibre and Polymer Technology – Theory – FKF3420

Infrastructure course

Course content:

Theoretical descriptions on:

X-ray interaction with matter
Basics of synchrotron radiation and x-ray sources
Refraction and reflection from interfaces
Diffraction: X-ray diffraction, grazing incidence wide-angle X-ray scattering
Scattering: X-ray reflectivity, small-angle X-ray scattering, grazing incidence small-angle X-ray scattering
Coherence: Coherent diffraction imaging, X-ray Photon Correlation Spectroscopy

Applied examples of in situ and in operando measurements will deepen the understanding

Learning objectives:

After completion of the course the doctoral student should have the knowledge and ability to

be able to explain the principles of synchrotron radiation generation and focusing
explain the functioning of a beamline at a 3rd generation synchrotron source
deduce key features in scattering patterns
analyze quantitatively atomistic and nanoscale information from experimental data

November 18 - December 4, 2024

ECTS:

LOCATION:

Stockholm

REGISTER BEFORE:

October 31, 2024

Schedule:

Schedule for the course

Contributors:

Literature:

J. Als-Nielsen, D. McMorrow: “Elements of modern X-ray Physics”, John Wiley & Sons, New York, 2011 J. Daillant, A. Gibaud (Eds.): “X-ray and Neutron Reflectivity”, Lecture Notes in Physics, Springer, Heidelberg, 2009 T.A. Ezquerra, M. Garcia-Gutierrez, A. Nogales, M. Gomez (Eds.): “Applications of synchrotron light to scattering and diffraction in materials and life sciences.”, Lecture Notes in Physics, Springer, Heidelberg, 2009

Prerequisites:

M.Sc. in chemistry, physics or comparable areas

Course fee:

Course responsible:

Stephan Roth, Mats Johansson

svroth@kth.se, matskg@kth.se

The course is given by KTH

The application is sent by e-mail to Mats Johansson matskg@kth.se or Stephan Roth svroth@kth.se